THE SCREENING OF GROWTH, CROP COMPONENT, AND RESISTANCE OF VARIOUS SWEET CORN LINES AGAINST DOWNY MILDEW ON S-3 GENERATION

Supriyanta, Bambang and Padmini, Oktavia S. and Kundarto, Muhamad and Wicaksono, Danar (2020) THE SCREENING OF GROWTH, CROP COMPONENT, AND RESISTANCE OF VARIOUS SWEET CORN LINES AGAINST DOWNY MILDEW ON S-3 GENERATION. In: Urban Development and Infrastructure. Urban development and Lifstyle, - . Nova Science Publisher, pp. 347-354. ISBN 97891531685607

Text Urban Development adan Lifestyle_2020_The Screening Of Growth, Yield Component, and Resistance Of Various Sweet Corn Lines Against Downy Mildew On S-3 Generation_Bambang Supriyanta.pdf Download (4MB)

Abstract

Sweet corn (Zea mays var. Saccharata) is a type of corn that includes horticultural crops. It is very popular in developed countries like America, Brazil, France, and developing countries. The need for sweet corn every year increases due to the growing population. Sweet corn is not only used as food, but also raw material for the corn sugar industry (Bakhri, 2007). Superior varieties can be obtained through plant breeding activities. One step in plant breeding activities is the expansion of genetic diversity through hybridization or crossing. Sweet corn is the result of a recessive mutation that occurs naturally in genes that control the conversion of sugar to starch in corn
endosperm.

Item Type:	Book Section
Subjects:	S Agriculture > S Agriculture (General)
Divisions:	Faculty of Engineering, Science and Mathematics > School of Engineering Sciences
Depositing User:	Dr. SP.MP BAMBANG SUPRIYANTA
Date Deposited:	02 Jun 2023 09:47
Last Modified:	02 Jun 2023 09:52
URI:	http://eprints.upnyk.ac.id/id/eprint/35770

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